In VLSI (Very Large Scale Integration) design, scan is a technique used to facilitate testing and debugging of digital circuits by making it easier to observe and control.

In VLSI (Very Large Scale Integration) design, understanding the distinction between static power and dynamic power is crucial for optimizing the performance and power efficiency of.

Physical design in VLSI (Very Large Scale Integration) refers to the process of converting a high-level logical design into a physical layout that can be fabricated on.

In VLSI design, OCV (On-Chip Variation), AOCV (Advanced On-Chip Variation), and POCV (Process On-Chip Variation) refer to methods and models used for accounting for variations in.

Optimizing for timing violations in VLSI (Very-Large-Scale Integration) involves various strategies to ensure the chip operates within its specified timing requirements, particularly.